Bug 2552231 (CVE-2026-98415)

Summary: CVE-2026-98415 kernel: soc: samsung: exynos-pmu: fix use-after-free of interrupt generator node
Product: [Other] Security Response Reporter: OSIDB Bzimport <bzimport>
Component: vulnerabilityAssignee: Product Security DevOps Team <prodsec-dev>
Status: NEW --- QA Contact:
Severity: medium Docs Contact:
Priority: medium    
Version: unspecifiedCC: akhatavk, aos-team-art-private, asdas, dpaolell, jdelft, jupierce, lgarciaa, mbiarnes, ppalepu, ppostler, prdhamdh, rhel-process-autobot, sghai, sidsharm, suppawar, vlaad, watson-tool-maintainers
Target Milestone: ---Keywords: Security
Target Release: ---   
Hardware: All   
OS: Linux   
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Fixed In Version: Doc Type: ---
Doc Text:
A flaw was found in the Linux kernel's Samsung Exynos Power Management Unit (PMU) driver. A local attacker could exploit a use-after-free vulnerability caused by the premature release of a device tree configuration node during CPU power management initialization. This issue may lead to a Denial of Service (DoS) via a system crash or unintended memory corruption.
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oVirt Team: --- RHEL 7.3 requirements from Atomic Host:
Cloudforms Team: --- Target Upstream Version:
Embargoed:

Description OSIDB Bzimport 2026-10-14 13:53:41 UTC
In the Linux kernel, the following vulnerability has been resolved:

soc: samsung: exynos-pmu: fix use-after-free of interrupt generator node

The setup_cpuhp_and_cpuidle() parses the device tree node for the
interrupt generation block via of_parse_phandle() and decrements its
reference count using of_node_put() immediately after fetching the resource
address. However, later the intr_gen_node pointer is passed into
of_syscon_register_regmap().

Fix this by declaring intr_gen_node with __free() and removing
of_node_put().